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Focused ion beam (FIB) in situ lift-out (INLO) technique showing

$ 30.00

4.8 (561) In stock

Focused Ion Beams (FIB) — Novel Methodologies and Recent

Ashley PAZ Y PUENTE, Assistant Professor, PhD Materials Science and Engineering (Northwestern), University of Cincinnati, Ohio, UC, Mechanical and Materials Engineering

FIB Sampling for Materials Scientists - NanoScope Services Ltd®

Tech Tips: 12 Reasons to Lift-Out TEM Samples

FIB Theory, PDF, Transmission Electron Microscopy

Emmanuel PEREZ, Senior Engineer, Materials Science and Engineering, PhD, Savannah River National Laboratory, South Carolina, SRNL

Combination of focused ion beam (FIB) and microtome by ultrathin

Focused ion beam (FIB) in situ lift-out (INLO) technique showing the

76043-01

Easylift in-situ lift-out workflow

A Focused Ion Beam-Scanning Transmission Electron Microscopy with

Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy

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